Comparing Various Resin Luting Cement Systems in Different Etching Modes Through Bond Durability and Morphological Features
This study aimed to investigate bond performance of various resin luting cement (RLC) systems on enamel and dentin in different etching modes and to compare the RLC-tooth interface morphology using scanning electron microscopy (SEM). The self-adhesive RLC systems used in combination with universal adhesives were as follows: Scotchbond Universal Adhesive Plus + RelyX Universal (3M Oral Care) and Clearfil Universal Bond Quick ER + SA Luting Multi (Kuraray Noritake Dental). These RLC systems were also used alone as self-adhesive RLC systems without universal adhesives (self-adhesive mode). The conventional RLC systems for comparison materials were as follows: BeautiBond Xtream + ResiCem EX (Shofu) and Tooth Primer + Panavia V5 (Kuraray Noritake Dental). Twelve specimens were prepared for each group to measure shear bond strength (SBS) in different etching modes. A stainless-steel rod was used as a substitute for indirect restorations. Bonded specimens were allocated to baseline (stored for 24 hours) and artificially aged (thermocycling [TC] for 10,000 cycles) groups. Representative treated tooth surfaces and RLC-tooth interfaces were observed using SEM. Three-way analysis of variance (ANOVA) revealed that all the factors (etching mode, storage period, and RLC system) had a significant influence on the enamel SBS values (p<0.05). Enamel SBS was significantly higher in etch-&-rinse (ER) mode than in self-etch (SE) mode, regardless of RLC system or storage period. Three-way ANOVA showed that all the factors had a significant influence on the dentin SBS values (p<0.001). Most RLC systems showed significantly higher dentin SBS in SE mode than in ER mode, regardless of storage period. However, the combination with Scotchbond Universal Adhesive Plus and RelyX Universal showed no significant difference in SBS values between etching modes at the baseline and showed a significantly higher SBS value in ER mode than in SE mode after TC. The self-adhesive RLC systems with universal adhesives tended to show higher enamel and dentin bond performance than the self-adhesive RLC systems alone. The morphology of treated tooth surfaces and resin cement-tooth interfaces were dependent on the RLC system and etching mode used. The RLC systems with primer application showed a thin, high-density layer above the intact dentin in both etching modes, suggesting chemical interaction.SUMMARY
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Representative SEM images of treated enamel surfaces. 1A - Ground with #320-grit SiC paper as a baseline specimen (5000×); 1B - Phosphoric acid pre-etching for 15 s as a baseline specimen (5000×); 1C - RU in SE mode (5000×); 1D - RU in ER mode (5000×); 1E - RUP in SE mode (5000×); 1F - RUP in ER mode (5000×); 1G - RX in SE mode (5000×); 1H - RX in ER mode (5000×); 1I - PV in SE mode (5000×); 1J - PV in ER mode (5000×).
Representative SEM images of treated dentin surfaces. 2A - Ground with #320-grit SiC paper as a baseline specimen (5000×); 2B - Phosphoric acid pre-etching for 15 s as a baseline specimen (5000×); 2C - RU without phosphoric acid etching (5000×); 2D - RU with phosphoric acid etching (5000×); 2E - RUP in SE mode (5000×); 2F - RUP in ER mode (5000×); 2G - RX in SE mode (5000×); 2H - RX in ER mode (5000×); 2I - PV in SE mode (5000×); 2J - PV in ER mode (5000×).
Representative SEM images of RLC system-enamel interfaces. 3A - RU in SE mode (5000× and 20,000×); 3B - RU in ER mode (5000× and 20,000×); 3C - RUP in SE mode (5000× and 20,000×); 3D - RUP in ER mode (5000× and 20,000×); 3E - RX in SE mode (5000× and 20,000×); 3F - RX in ER mode (5000× and 20,000×); 3G - PV in SE mode (5000× and 20,000×); 3H - PV in ER mode (5000× and 20,000×).
Representative SEM images of the RLC system-dentin interfaces. 4A - RU in SE mode (5000× and 20,000×); 4B - RU in ER mode (5000× and 20,000×); 4C - RUP in SE mode (5000× and 20,000×); 4D - RUP in ER mode (5000× and 20,000×); 4E - RX in SE mode (5000× and 20,000×); 4F - RX in ER mode (5000× and 20,000×); 4G - PV in SE mode (5000× and 20,000×); 4H - PV in ER mode (5000× and 20,000×). Abbreviations: HL, hybrid layer; PL, primer layer; RL, reaction layer.
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